The 48th SMIIC MC Training within the SMIIC MC Work Plan 2024 – 2026 V3 was the The training on Fundamentals of Statistical Data Analysis in Metrology held on the 10 November 2026 virtually, technically hosted by SMIIC General Secretariat. 24 experts participated in the training.
The training was hosted by NMI: Emirates Metrology Institute (EMI)
General Description: This training provides essential knowledge of the statistical methods applied in metrology, covering the fundamentals of measurement data analysis, descriptive statistics, data screening, outlier detection, and robust statistical techniques in accordance with ISO 13528.
Objective, expected outcome: To enable participants to understand the statistical principles underlying measurement results, apply appropriate techniques to summarize and screen data, identify outliers, and use robust statistical methods to obtain reliable estimates.
Who should attend: This course is designed for metrologists, calibration and testing laboratory personnel, PT providers, quality managers, technical assessors, and all professionals involved in evaluating measurement results and laboratory performance.
References: ISO 13528 for statistical analysis; ISO/IEC 17043 for PT requirements.
Lecturer/s: Prof. Dr. Hala M. Abdel Mageed Mosaad
Subject/Activities:
- Fundamentals of statistics in metrology.
- Measurement data, probability distributions, and descriptive statistics.
- Data screening, outlier detection, and robust statistical methods (ISO 13528).
- Practical exercises and discussion.